Development of a Tabletop Setup for the Transient Current Technique Using Two-Photon Absorption in Silicon Particle Detectors

The transient current technique (TCT) is widely used in the field of silicon particle detector development. So far, only laser wavelengths with a photon energy larger than or similar to the silicon bandgap (single photon absorption) were used. Recently, measurements using two-photon absorption (TPA) for silicon detector testing have been carried out for the first time. Excess carriers are only created at the focal point of the laser beam and thus resolution in all three spatial directions could be achieved. The resolution perpendicular to the incident laser beam could be increased roughly by a factor of 10. First measurements using this new method were performed at the Singular Laser Facility of Universidad del Pais Vasco (UPV)/Euskal Herriko Unibertzitatea (EHU). Following the initial success of the method, a compact TPA-TCT setup is under development. A first description of the setup and laser system is presented in this articleThis work was supported in part by the Spanish Ministry of Economy and Competitiveness (MINECO) under Grant FPA2013-48387-C6-1-P and in part by the Wolfgang Gentner Programme of the German Federal Ministry of Education and Research under Grant 05E15CH

Synchronous interferometric broadband measurement of dispersion applied to manufacturing optimization of microstructured optical fibers

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